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Volumn 81, Issue 5, 1998, Pages 1015-1018
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Structural characterization of various chiral smectic-C phases by resonant X-ray scattering
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000679246
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.81.1015 Document Type: Article |
Times cited : (364)
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References (22)
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