Biaxiality and temperature dependence of 3- and 4-layer intermediate smectic-phase structures as revealed by resonant X-ray scattering

Europhysics Letters

Volumn 72, Issue 6, 2005, Pages 976-982

  Roberts, N W ^a   Jaradat, S ^a   Hirst, L S ^a,b   Thurlow, M S ^a   Wang, Y ^a   Wang, S T ^c   Liu, Z Q ^c   Huang, C C ^c   Bai, J ^d   Pindak, R ^d   Gleeson, H F ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b Florida State University   (United States)

^c University of Minnesota   (United States)

^d BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 29144534000     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i2005-10336-3     Document Type: Article

References (12)

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