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Volumn 38, Issue 1, 2007, Pages 222-225

A-Si robust gate driver for 7.0-in. WVGA LCD panel

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; GLASS; HYDROGENATION; LIQUID CRYSTAL DISPLAYS; THIN FILM TRANSISTORS;

EID: 34547862121     PISSN: 0097966X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1889/1.2785269     Document Type: Conference Paper
Times cited : (14)

References (9)
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    • J. H. Jung, H. Kim, et al.: SID (2005) 1538.
  • 3
    • 33644608637 scopus 로고    scopus 로고
    • J. W. Choi, Y. S. Kim, et al.: IDW/AD (2005) 1105.
    • J. W. Choi, Y. S. Kim, et al.: IDW/AD (2005) 1105.
  • 4
    • 34547893686 scopus 로고    scopus 로고
    • US Patent 5,222,082
    • US Patent 5,222,082
  • 5
    • 0034215744 scopus 로고    scopus 로고
    • The instability mechanisms of hydrogenated amorphous silicon thin film transistor under AC bias stress
    • C.Y. Huang et al., "The instability mechanisms of hydrogenated amorphous silicon thin film transistor under AC bias stress", Jpn. J. Appl. Phys. 39 (2000) 3867
    • (2000) Jpn. J. Appl. Phys , vol.39 , pp. 3867
    • Huang, C.Y.1
  • 6
    • 33644584221 scopus 로고    scopus 로고
    • C. C. Wei, W.C. Lin, S. H. Lo, C. J. Chang, and Y. E. Wu, Integrated gate driver circuit using a-Si TFT, IDW '05, pp. 1023-1025, 2005.
    • C. C. Wei, W.C. Lin, S. H. Lo, C. J. Chang, and Y. E. Wu, "Integrated gate driver circuit using a-Si TFT", IDW '05, pp. 1023-1025, 2005.
  • 7
    • 34547892897 scopus 로고    scopus 로고
    • H. Lebrun, T. Kretz, J. Magarino, N. Szydlo: SID (2005) 950.
    • H. Lebrun, T. Kretz, J. Magarino, N. Szydlo: SID (2005) 950.
  • 8
    • 33744546859 scopus 로고
    • Defect pool in amorphous-silicon thin-film transistors
    • M. J. Powell, C. van Berkel, et al., "Defect pool in amorphous-silicon thin-film transistors", Phys. Rev. B 45 (1992) 4160
    • (1992) Phys. Rev. B , vol.45 , pp. 4160
    • Powell, M.J.1    van Berkel, C.2
  • 9
    • 0032154561 scopus 로고    scopus 로고
    • Electrical instability of hydrogenated amorphous silicon thin-film transistors for active-matrix liquid-crystal displays
    • J. Kanicki et al., "Electrical instability of hydrogenated amorphous silicon thin-film transistors for active-matrix liquid-crystal displays", Jpn. J. Appl. Phys. 37 (1998) 4704
    • (1998) Jpn. J. Appl. Phys , vol.37 , pp. 4704
    • Kanicki, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.