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Volumn 40, Issue 1-5, 2001, Pages 171-180

Processing and characterization of LiNbO3 thin film for metal ferroelectric semiconductor field effect transistor (MFSFET) application

Author keywords

C V; LiNbO3; MFSFET; P V

Indexed keywords

CHARACTERIZATION; FIELD EFFECT TRANSISTORS; LITHIUM COMPOUNDS; PROCESSING;

EID: 34547752936     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580108010840     Document Type: Article
Times cited : (1)

References (10)
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    • Sumi T. et. al. (Matsushita-Panasonic), ISSCC Digest, paper FA16.2, pp. 68, (1994)
  • 7
    • 0028578360 scopus 로고    scopus 로고
    • Charles H.-J.Huang, Integ. Ferroele., 5, pp. 13-18, (1994)
    • Charles H.-J.Huang, Integ. Ferroele., 5, pp. 13-18, (1994)
  • 9
    • 0010353535 scopus 로고    scopus 로고
    • W.P. Li, Appl. Phys. Lett., 77(4), pp. 564-566, (2000)
    • (2000) Appl. Phys. Lett , vol.77 , Issue.4 , pp. 564-566
    • Li, W.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.