Preliminary synchrotron radiation characterization of first multilayer mirrors for the soft X-ray water window

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 62, Issue 6-7 SPEC. ISS., 2007, Pages 586-592

  Cinque, Gianfelice ^a   Grilli, Antonio ^b   Cibin, Giannantonio ^c   Raco, Agostino ^b   Patelli, Alessandro ^d   Mattarello, Valentina ^d   Marcelli, Augusto ^b   Rigato, Valentino ^d  

^a RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^b INFN LABORATORI NAZIONALI DI FRASCATI   (Italy)

^c LABORATORI NAZIONALI DI LEGNARO   (Italy)

^d IMONT   (Italy)

Author keywords

Ni Ti Ni TiO2 multilayers; Soft X ray optics; SR reflectometer; SR soft X rays; Water window optics

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; MIRRORS; X RAY SPECTROSCOPY;

NI/TI NI/TIO2 MULTILAYERS; SOFT X-RAY OPTICS; SR REFLECTOMETER; SR SOFT X-RAYS; WATER-WINDOW OPTICS;

SYNCHROTRON RADIATION;

EID: 34547686262     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2007.03.028     Document Type: Article

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