Colloidal crystals as templates for macroporous carbon electrodes of controlled thickness

Electroanalysis

Volumn 19, Issue 2-3, 2007, Pages 379-384

  Reculusa, Stéphane ^a   Agricole, Béatrice ^a   Derré, Alain ^a   Couzi, Michel ^b   Sellier, Elisabeth ^b   Delhaès, Pierre ^a   Ravaine, Serge ^a  

^a CNRS   (France)

^b UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

Carbon electrodes; Controlled thickness; Langmuir Blodgett; Porous materials

Indexed keywords

CARBON FILMS; COLLOIDS; CYCLIC VOLTAMMETRY; ELECTRODES; SCANNING ELECTRON MICROSCOPY;

CARBON ELECTRODE; CARBON MEMBRANE; CHEMICAL VAPOR INFILTRATION PROCESS; COLLOIDAL CRYSTALS; CONTROLLED THICKNESS; FREE STANDINGS; LANGMUIR BLODGETT TECHNIQUES; LANGMUIR-BLODGETT; MACROPOROUS CARBON; SYNTHESISED;

POROUS MATERIALS;

EID: 34547606154     PISSN: 10400397     EISSN: 15214109     Source Type: Journal    
DOI: 10.1002/elan.200603743     Document Type: Conference Paper

References (22)

1. O. D. Velev, T. A. Jede, R. F. Lobo, A. M. Lenhoff, Nature 1997, 389, 447.
2. A. Imhof, D. J. Pine, Nature 1997, 389, 948.
3. B. T. Holland, C. F. Blanford, A. Stein, Science 1998, 281, 538.
4. J. E. G. J. Wijnhoven, W. L. Vos, Science 1998, 281, 802.
5. P. Yang, T. Deng, D. Zhao, P. Feng, D. Pine, B. F. Chmelka, G. M. Whitesides, G. D. Stucky, Science 1998, 282, 2244.
6. S. H. Park, Y. N. Xia, Chem. Mater. 1998, 10, 1745.
7. S. A. Johnson, P. J. Ollivier, T. E. Mallouk, Science 1999, 283, 963.
8. A. A. Zakhidov, R. H. Baughman, Z. Iqbal, C. Cui, I. Khayrullin, S. O. Dantas, J. Marti, V. G. Ralchenko, Science 1998, 282, 897.
9. Y. A. Vlasov, N. Yao, D. J. Norris, Adv. Mater. 1999, 11, 165.
10. T.-W. Kim, I.-S. Park, R. Ryoo, Angew. Chem. Int. Ed. 2003, 42, 4375.
11. Z. Zhou, Q. Yan, F. Su, X. S. Zhao, J. Mater. Chem. 2005, 15, 2569.
12. P. Kim, J. B. Joo, W. Kim, S. K. Kang, I. K. Song, J. Yi, Carbon 2006, 44, 389.
13. S. B. Yoon, G. S. Chai, S. K. Kang, J.-S. Yu, K. P. Gierszal, M. Jaroniec, J. Am. Chem. Soc. 2005, 127, 4188.
14. T. Chen, S. C. Barton, G. Binyamin, Z. Q. Gao, Y. C. Zhang, H. H. Kim, A. Heller, J. Am. Chem. Soc. 2001, 123, 8630.
15. A. Heller, PhysChemChemPhys 2004, 6, 209.
16. I. Willner, E. Katz, Angew. Chem. Int. Ed. Engl. 2000, 39, 1180.
17. B. Ballesteros Katemann, W. Schuhmann, Electroanalysis 2002, 14, 22.
18. W. Stöber, A. Fink, E. Bohn, J. Colloid Interface Sci. 1968, 26, 62.
19. S. Reculusa, S. Ravaine, Chem. Mater. 2003, 15, 598.
20. P. C. Eklund, J. M. Holden, R. A. Jishi, Carbon 1995, 33, 959.
21. A. C. Ferrari, J. Robertson, Phys. Rev. B 2000, 61, 14095.
22. H. Nishihara, Adv. Inorg. Chem. 2002, 53, 41.