-
1
-
-
32144457196
-
-
Wildgoose, G. G.; Banks, C. E.; Compton, R. G. Small 2006, 2, 182.
-
(2006)
Small
, vol.2
, pp. 182
-
-
Wildgoose, G.G.1
Banks, C.E.2
Compton, R.G.3
-
2
-
-
33746345598
-
-
Ye, X. R.; Chen, L. H.; Wang, C.; Aubuchon, J. F.; Chen, I. C.; Gapin, A. I.; Talbot, J. B.; Jin, S. J. Phys. Chem. B 2006, 110, 12938.
-
(2006)
J. Phys. Chem. B
, vol.110
, pp. 12938
-
-
Ye, X.R.1
Chen, L.H.2
Wang, C.3
Aubuchon, J.F.4
Chen, I.C.5
Gapin, A.I.6
Talbot, J.B.7
Jin, S.8
-
3
-
-
33646465171
-
-
Qu, L.; Dai, L.; Osawa, E. J. Am. Chem. Soc. 2006, 128, 5523.
-
(2006)
J. Am. Chem. Soc
, vol.128
, pp. 5523
-
-
Qu, L.1
Dai, L.2
Osawa, E.3
-
6
-
-
23144462910
-
-
Chen, Z.; Appenzeller, J.; Knoch, J.; Lin, Y.; Avouris, P. Nano Lett. 2005, 5, 1497.
-
(2005)
Nano Lett
, vol.5
, pp. 1497
-
-
Chen, Z.1
Appenzeller, J.2
Knoch, J.3
Lin, Y.4
Avouris, P.5
-
7
-
-
0042991275
-
-
Javey, A.; Guo, J.; Wang, Q.; Lundstrom, M.; Dai, H. Nature 2003, 424, 654.
-
(2003)
Nature
, vol.424
, pp. 654
-
-
Javey, A.1
Guo, J.2
Wang, Q.3
Lundstrom, M.4
Dai, H.5
-
8
-
-
0035860306
-
-
Kong, J.; Chapline, M. G.; Dai, H. Adv. Mater. 2001, 13, 1384.
-
(2001)
Adv. Mater
, vol.13
, pp. 1384
-
-
Kong, J.1
Chapline, M.G.2
Dai, H.3
-
9
-
-
0002250337
-
-
Lundström, I.; Shivaraman, S.; Svensson, C.; Lundkvist, L. Appl. Phys. Lett. 1975, 26, 55.
-
(1975)
Appl. Phys. Lett
, vol.26
, pp. 55
-
-
Lundström, I.1
Shivaraman, S.2
Svensson, C.3
Lundkvist, L.4
-
10
-
-
33751295400
-
-
Star, A.; Joshi, V.; Skarupo, S.; Thomas, D.; Gabriel, J. -C. P. J. Phys. Chem. B 2006, 110, 21014.
-
(2006)
J. Phys. Chem. B
, vol.110
, pp. 21014
-
-
Star, A.1
Joshi, V.2
Skarupo, S.3
Thomas, D.4
Gabriel, J.-C.P.5
-
12
-
-
32244440113
-
-
Star, A.; Tu, E.; Niemann, J.; Gabriel, J. -C. P.; Joiner, C. S.; Valcke, C. Proc. Natl. Acad. Sci. U.S.A. 2006, 103, 921.
-
(2006)
Proc. Natl. Acad. Sci. U.S.A
, vol.103
, pp. 921
-
-
Star, A.1
Tu, E.2
Niemann, J.3
Gabriel, J.-C.P.4
Joiner, C.S.5
Valcke, C.6
-
13
-
-
32644451695
-
-
Kim, B. -K.; Park, N.; Na, P. S.; So, H. -M.; Kim, J. -J.; Kim, H.; Kong, K. -J.; Chang, H.; Ryu, B. -H.; Choi, Y.; Lee, J. -O. Nanotechnology 2006, 17, 496.
-
(2006)
Nanotechnology
, vol.17
, pp. 496
-
-
Kim, B.-K.1
Park, N.2
Na, P.S.3
So, H.-M.4
Kim, J.-J.5
Kim, H.6
Kong, K.-J.7
Chang, H.8
Ryu, B.-H.9
Choi, Y.10
Lee, J.-O.11
-
14
-
-
0005836651
-
-
Martel, R.; Schmidt, T.; Shea, H. R.; Hertel, T.; Avouris, P. Appl. Phys. Lett. 1998, 73, 2447.
-
(1998)
Appl. Phys. Lett
, vol.73
, pp. 2447
-
-
Martel, R.1
Schmidt, T.2
Shea, H.R.3
Hertel, T.4
Avouris, P.5
-
15
-
-
0037475108
-
-
(a) Snow, E. S.; Novak, J. P.; Campbell, P. M.; Park, D. Appl. Phys. Lett. 2003, 82, 2145.
-
(2003)
Appl. Phys. Lett
, vol.82
, pp. 2145
-
-
Snow, E.S.1
Novak, J.P.2
Campbell, P.M.3
Park, D.4
-
16
-
-
17044368327
-
-
(b) Snow, E. S.; Campbell, P. M.; Ancona, M. G.; Novak, J. P. Appl. Phys. Lett. 2005, 86, 033105.
-
(2005)
Appl. Phys. Lett
, vol.86
, pp. 033105
-
-
Snow, E.S.1
Campbell, P.M.2
Ancona, M.G.3
Novak, J.P.4
-
17
-
-
34547608159
-
-
Using the NTFET device as a working electrode allowed cyclic voltammetry measurements; this is further shown in the Supporting Information, Figure S1
-
Using the NTFET device as a working electrode allowed cyclic voltammetry measurements; this is further shown in the Supporting Information, Figure S1.
-
-
-
-
18
-
-
0034629474
-
-
A general decrease in conductance was noticed when measurements were taken under nitrogen flow as compared to ambient atmosphere; this results from purging the electron-withdrawing O2 from the flow chamber. For an explanation of CNT sensitivity toward oxygen see: Collins, P. G, Bradley K, Ishigami, M, Zettl, A. Science, 2000, 287, 1801
-
2 from the flow chamber. For an explanation of CNT sensitivity toward oxygen see: Collins, P. G.; Bradley K.; Ishigami, M.; Zettl, A. Science, 2000, 287, 1801.
-
-
-
-
19
-
-
33645498138
-
-
Zhang, J.; Boyd, A.; Tselev, A.; Paranjape, M.; Barbara, P. Appl. Phys. Lett. 2006, 88, 123112.
-
(2006)
Appl. Phys. Lett
, vol.88
, pp. 123112
-
-
Zhang, J.1
Boyd, A.2
Tselev, A.3
Paranjape, M.4
Barbara, P.5
-
24
-
-
19944401860
-
-
Zhao, Q.; Nardelli, M. B.; Lu, W.; Bernholc, J. Nano Lett. 2005, 5, 847.
-
(2005)
Nano Lett
, vol.5
, pp. 847
-
-
Zhao, Q.1
Nardelli, M.B.2
Lu, W.3
Bernholc, J.4
-
25
-
-
0037009625
-
-
Heinze, S.; Tersoff, J.; Martel, R.; Derycke, V.; Appenzeller, J.; Avouris, P. Phys. Rev. Lett. 2002, 89, 106801.
-
(2002)
Phys. Rev. Lett
, vol.89
, pp. 106801
-
-
Heinze, S.1
Tersoff, J.2
Martel, R.3
Derycke, V.4
Appenzeller, J.5
Avouris, P.6
-
26
-
-
0003752338
-
-
Cambridge University Press: Cambridge, U.K
-
Zangwill, A. Physics at Surfaces; Cambridge University Press: Cambridge, U.K., 1988.
-
(1988)
Physics at Surfaces
-
-
Zangwill, A.1
-
27
-
-
18144377436
-
-
Kolmakov, A.; Klenov, D. O.; Lilach, Y.; Stemmer, S.; Moskovits, M. Nano Lett. 2005, 5, 667.
-
(2005)
Nano Lett
, vol.5
, pp. 667
-
-
Kolmakov, A.1
Klenov, D.O.2
Lilach, Y.3
Stemmer, S.4
Moskovits, M.5
-
28
-
-
33845723177
-
-
Ruffino, F.; Grimaldi, M. G.; Giannazzo, F.; Roccaforte, F.; Raineri, V. Appl. Phys. Lett. 2006, 89, 243113.
-
(2006)
Appl. Phys. Lett
, vol.89
, pp. 243113
-
-
Ruffino, F.1
Grimaldi, M.G.2
Giannazzo, F.3
Roccaforte, F.4
Raineri, V.5
-
29
-
-
33749677721
-
-
Hecht, D. S.; Ramirez, R. J. A.; Briman, M.; Artukovic, E.; Chichak, K. S.; Stoddart, J. F.; Grüner, G. Nano Lett. 2006, 6, 2031.
-
(2006)
Nano Lett
, vol.6
, pp. 2031
-
-
Hecht, D.S.1
Ramirez, R.J.A.2
Briman, M.3
Artukovic, E.4
Chichak, K.S.5
Stoddart, J.F.6
Grüner, G.7
-
31
-
-
33745685342
-
-
Nosho, Y.; Ohno, Y.; Kishimoto, S.; Mizutani, T. Nanotechnology 2006, 17, 3412.
-
(2006)
Nanotechnology
, vol.17
, pp. 3412
-
-
Nosho, Y.1
Ohno, Y.2
Kishimoto, S.3
Mizutani, T.4
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