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Volumn 62, Issue 6-7 SPEC. ISS., 2007, Pages 554-557

Modeling of glancing incidence X-ray for depth profiling of thin layers

Author keywords

Depth profiling; Glancing incidence diffraction; Gold; Simulation; Thin film; XRD

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; X RAY ABSORPTION SPECTROSCOPY; X RAY DIFFRACTION;

EID: 34547559061     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2007.02.012     Document Type: Article
Times cited : (18)

References (10)
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  • 2
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    • Depth profile characterization of electrodeposited multi-thin-film structures by low angle of incidence X-ray diffractometry
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  • 3
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    • In situ grazing incidence X-ray diffraction study of strain evolution during growth and postgrowth annealing of MnAs on GaAs (113)A
    • Satapathy D.K., Jenichen B., Braun W., Kaganer V.M., Däweritz L., and Ploog K.H. In situ grazing incidence X-ray diffraction study of strain evolution during growth and postgrowth annealing of MnAs on GaAs (113)A. J. Phys., D. Appl. Phys. 38 (2005) A164-A168
    • (2005) J. Phys., D. Appl. Phys. , vol.38
    • Satapathy, D.K.1    Jenichen, B.2    Braun, W.3    Kaganer, V.M.4    Däweritz, L.5    Ploog, K.H.6
  • 4
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    • Noma, T.1    Takada, K.2    Lida, A.3
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  • 8
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    • Evanescent absorption in kinematic surface Bragg diffraction
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.