-
1
-
-
84893997651
-
-
http://www.warrenknight.com/WKClinometers.html.
-
-
-
-
2
-
-
0016543811
-
Active annular-beam laser autocollimator system
-
P. R. Yoder, Jr., E. R. Schlesinger, and J. L. Chickvary, "Active annular-beam laser autocollimator system," Appl. Opt. 14, 1890-1895 (1975).
-
(1975)
Appl. Opt
, vol.14
, pp. 1890-1895
-
-
Yoder Jr., P.R.1
Schlesinger, E.R.2
Chickvary, J.L.3
-
3
-
-
0021422663
-
Single axis photoelectronic autocollimator
-
G. G. Luther and R. D. Deslattes, "Single axis photoelectronic autocollimator," Rev. Sci. Instrum. 55, 747-750 (1984).
-
(1984)
Rev. Sci. Instrum
, vol.55
, pp. 747-750
-
-
Luther, G.G.1
Deslattes, R.D.2
-
4
-
-
84975560634
-
An interferometer for precision angle measurement
-
J. Rohlin, "An interferometer for precision angle measurement," Appl. Opt. 2, 762-763 (1963).
-
(1963)
Appl. Opt
, vol.2
, pp. 762-763
-
-
Rohlin, J.1
-
5
-
-
0014824199
-
Interferometric measurement of angles
-
D. Malacara and O. Harris, "Interferometric measurement of angles," Appl. Opt. 9, 1630-1633 (1970).
-
(1970)
Appl. Opt
, vol.9
, pp. 1630-1633
-
-
Malacara, D.1
Harris, O.2
-
6
-
-
84975624001
-
New optical methods for measuring small-angle rotations
-
P. Shi and E. Stijns, "New optical methods for measuring small-angle rotations," Appl. Opt. 27, 4342-4344 (1988).
-
(1988)
Appl. Opt
, vol.27
, pp. 4342-4344
-
-
Shi, P.1
Stijns, E.2
-
7
-
-
0347014637
-
Angle measurement based on the internal reflection effect: A new method
-
P. S. Huang, S. Kiyono, and O. Kamada. "Angle measurement based on the internal reflection effect: a new method," Appl. Opt. 31, 6047-6055 (1992).
-
(1992)
Appl. Opt
, vol.31
, pp. 6047-6055
-
-
Huang, P.S.1
Kiyono, S.2
Kamada, O.3
-
8
-
-
19844378845
-
Angle measurement based on the internal-reflection effect and the use of right-angle prisms
-
P. S. Huang and J. Ni, "Angle measurement based on the internal-reflection effect and the use of right-angle prisms," Appl. Opt. 34, 4976-4981 (1995).
-
(1995)
Appl. Opt
, vol.34
, pp. 4976-4981
-
-
Huang, P.S.1
Ni, J.2
-
9
-
-
7544228219
-
Instrument for measuring small angles by use of multiple total internal reflections in heterodyne interferometry
-
M. H. Chiu, S. F. Wang, and R. S. Chang, "Instrument for measuring small angles by use of multiple total internal reflections in heterodyne interferometry," Appl. Opt. 43, 5438-5442 (2004).
-
(2004)
Appl. Opt
, vol.43
, pp. 5438-5442
-
-
Chiu, M.H.1
Wang, S.F.2
Chang, R.S.3
-
10
-
-
0344686365
-
High-resolution two-dimensional angle measurement technique based on fringe analysis
-
Z. Ge and M. Takeda, "High-resolution two-dimensional angle measurement technique based on fringe analysis," Appl. Opt. 42, 6859-6868 (2003).
-
(2003)
Appl. Opt
, vol.42
, pp. 6859-6868
-
-
Ge, Z.1
Takeda, M.2
-
11
-
-
34547546394
-
Non-contact laser speckle sensor for measuring one- and two-dimensional angular displacement
-
B. Rose, H. Imam, and S. G. Hanson, "Non-contact laser speckle sensor for measuring one- and two-dimensional angular displacement," J. Opt. 29, 115-120 (1998).
-
(1998)
J. Opt
, vol.29
, pp. 115-120
-
-
Rose, B.1
Imam, H.2
Hanson, S.G.3
-
12
-
-
0038807093
-
Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns
-
X. Dai, O. Sasaki, J. E. Greivenkamp, and T. Suzuki, "Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns," Appl. Opt. 35, 5657-5666 (1996).
-
(1996)
Appl. Opt
, vol.35
, pp. 5657-5666
-
-
Dai, X.1
Sasaki, O.2
Greivenkamp, J.E.3
Suzuki, T.4
-
13
-
-
2542418952
-
Simple three-dimensional laser angle sensor for three-dimensional small-angle measurement
-
C. H. Liu, W. Y. Jywe, and S. C. Tzeng, "Simple three-dimensional laser angle sensor for three-dimensional small-angle measurement," Appl. Opt. 43, 2840-2845 (2004).
-
(2004)
Appl. Opt
, vol.43
, pp. 2840-2845
-
-
Liu, C.H.1
Jywe, W.Y.2
Tzeng, S.C.3
-
14
-
-
23744444276
-
Wavelength scanning digital interference holography for variable tomographic scanning
-
L. Yu and M. Kim, "Wavelength scanning digital interference holography for variable tomographic scanning," Opt. Express 13, 5621-5627 (2005).
-
(2005)
Opt. Express
, vol.13
, pp. 5621-5627
-
-
Yu, L.1
Kim, M.2
-
15
-
-
33644941731
-
Variable tomographic scanning with wave-length scanning digital interference holography
-
L. Yu and M. Kim, "Variable tomographic scanning with wave-length scanning digital interference holography," Opt. Commun 260, 462-468 (2006).
-
(2006)
Opt. Commun
, vol.260
, pp. 462-468
-
-
Yu, L.1
Kim, M.2
-
16
-
-
0027927173
-
Direct recording of holograms by a CCD target and numerical reconstruction
-
U. Schnars and W. Jüptner, "Direct recording of holograms by a CCD target and numerical reconstruction," Appl. Opt. 33, 179-181 (1994).
-
(1994)
Appl. Opt
, vol.33
, pp. 179-181
-
-
Schnars, U.1
Jüptner, W.2
-
17
-
-
0011346226
-
Spatial filtering for zero-order and twin-image elimination in digital off-axis holography
-
E. Cuche, P. Marquet, and C. Depeursinge, "Spatial filtering for zero-order and twin-image elimination in digital off-axis holography," Appl. Opt. 39, 4070-4075 (2000).
-
(2000)
Appl. Opt
, vol.39
, pp. 4070-4075
-
-
Cuche, E.1
Marquet, P.2
Depeursinge, C.3
-
18
-
-
33846586693
-
Direct full compensation of the aberrations in quantitative phase microscopy of thin objects by a single digital hologram
-
L. Miccio, D. Alfieri, S. Grilli, P. Ferraro, A. Finizio, L. De Petrocellis, and S. D. Nicola, "Direct full compensation of the aberrations in quantitative phase microscopy of thin objects by a single digital hologram," Appl. Phys. Lett. 90, 041104 (2007).
-
(2007)
Appl. Phys. Lett
, vol.90
, pp. 041104
-
-
Miccio, L.1
Alfieri, D.2
Grilli, S.3
Ferraro, P.4
Finizio, A.5
De Petrocellis, L.6
Nicola, S.D.7
-
19
-
-
33645155396
-
Automatic procedure for aberration compensation in digital holographic microscopy and applications to specimen shape compensation
-
T. Colomb, E. Cuche, F. Charrière, J. Kühn, N. Aspert, F. Montfort, P. Marquet, and C. Depeursinge, "Automatic procedure for aberration compensation in digital holographic microscopy and applications to specimen shape compensation," Appl. Opt. 45, 851-863 (2006).
-
(2006)
Appl. Opt
, vol.45
, pp. 851-863
-
-
Colomb, T.1
Cuche, E.2
Charrière, F.3
Kühn, J.4
Aspert, N.5
Montfort, F.6
Marquet, P.7
Depeursinge, C.8
-
20
-
-
33845593416
-
Numerical parametric lens for shifting, magnification and complete aberration compensation in digital holographic microscopy
-
T. Colomb, F. Montfort, J. Kühn, N. Aspert, E. Cuche, A. Marian, F. Charrière, S. Bourquin, P. Marquet, and C. Depeursinge, "Numerical parametric lens for shifting, magnification and complete aberration compensation in digital holographic microscopy," J. Opt. Soc. Am. A 23, 3177-3190 (2006).
-
(2006)
J. Opt. Soc. Am. A
, vol.23
, pp. 3177-3190
-
-
Colomb, T.1
Montfort, F.2
Kühn, J.3
Aspert, N.4
Cuche, E.5
Marian, A.6
Charrière, F.7
Bourquin, S.8
Marquet, P.9
Depeursinge, C.10
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