Measurement of two-dimensional small rotation angles by using orthogonal parallel interference patterns

Applied Optics

Volumn 35, Issue 28, 1996, Pages 5657-5666

  Dai, Xiaoli ^a   Sasaki, Osami ^a   Greivenkamp, John E ^b   Suzuki, Takamasa ^a  

^a NIIGATA UNIVERSITY   (Japan)

^b UNIVERSITY OF ARIZONA   (United States)

Author keywords

Interferometry; Orthogonal parallel interference patterns; Two dimensional small rotation angles

Indexed keywords

EID: 0038807093     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.005657     Document Type: Article

References (8)

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