Simple three-dimensional laser angle sensor for three-dimensional small-angle measurement

Applied Optics

Volumn 43, Issue 14, 2004, Pages 2840-2845

  Liu, Chien Hung ^a,b   Jywe, Wen Yuh ^d   Tzeng, S C ^a,c  

^a Chienkuo University of Technology   (Taiwan)

^b Institute of Mechtronoptic Systems   (Taiwan)

^c Department of Mechanical Engineering ^*

^d NATIONAL FORMOSA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; INTERFEROMETRY; MIRRORS; OPTICAL SYSTEMS; PHOTODETECTORS; THEOREM PROVING;

ANGULAR MOTION; SMALL-ANGLE ROTATION;

OPTICAL SENSORS;

EID: 2542418952     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.43.002840     Document Type: Article

References (15)

1. A. K. Nassim, L. Joannes, and A. Cornet, "In-plane rotation analysis by two-wavelength electronic speckle interferometry," Appl. Opt. 38, 2467-2470 (1999).
2. R. Jabconaki, "Angle interference measurement," presented at the First International Symposium on Metrology for Quality Control in Production, Tokyo, July 10-13, 1984).
3. K. M. Abedin, M. Wahadoszamen, and A. P. M. Y. Haider, "Measurement of in-plane motions and rotations using a simple electronic speckle pattern interferometer," Opt. Laser Technol. 34, 293-298 (2002).
4. R. Jones and C. Wykes, Holographic and Speckle Interferometry (Cambridge U. Press, Cambridge, UK, 1989).
5. A. E. Ennos, "Speckle interferometry," Prog. Opt. 16, 233-288 (1978).
6. A. E. Ennos, "Measurement of in-plane surface strain by hologram interferometry," J. Sci. Instrum, 1, 713-717 (1968).
7. C. A. Sciammarella and J. A. Gilbert, "A holographic-moiré technique to obtain separate patterns for components of displacement," Exp. Mech. 16, 215-219 (1976).
8. L. Pirodda, "Conjugate wave holograph interferometry for the measurement of in-plane deformations," Appl. Opt. 28, 1842-1844 (1989).
9. Y. L. Lay and W. Y. Chen, "Rotation measurement using a circular moiré grating," Opt. Laser Technol. 30, 539-544 (1998).
10. W. D. Zhou, "Interferometer for small-angle measurement based on total internal reflection," Appl. Opt. 37, 5957-5963 (1998).
11. P. S. Huang, S. Kiyono, and O. Kamada, "Angle measurement based on the internal-reflection effect: a new method," Appl. Opt. 31, 6047-6045 (1992).
12. X. Dai, "High accuracy, wide range, rotation angle measurement by the use of two parallel interference patterns," Appl. Opt. 38, 6190-6195 (1997).
13. P. S. Huang and Y. Li, "Small-angle measurement by use of a single prism," Appl. Opt. 37, 6636-6642 (1998).
14. X. Y. Fang and M. S. Cao, "Theoretical analysis of 2D laser angle sensor and several design parameters," Opt. Laser Technol. 34, 225-229 (2004).
15. E. W. Bae, J. A. Kim, and S. H. Kim, "Multi-degree-of-freedom displacement measurement system for milli-structures," Meas. Sci. Technol. 12, 1495-1502 (2001).