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Volumn 76, Issue 1, 2007, Pages

Coherent x-ray diffraction imaging of grown-in antiphase boundaries in Fe65 Al35

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EID: 34547516040     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.014204     Document Type: Article
Times cited : (11)

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