A comparison of textures measured using X-ray and electron backscatter diffraction

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 38, Issue 8, 2007, Pages 1845-1855

  Wright, Stuart I ^a   Nowell, Matthew M ^a   Bingert, John F ^b  

^a EDAX TSL   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; CRYSTAL ORIENTATION; RELIABILITY ANALYSIS; STAINLESS STEEL; STATISTICS; TEXTURES; VOLUME FRACTION; X RAY DIFFRACTION ANALYSIS;

CRYSTALLOGRAPHIC ORIENTATIONS; SINGLE ORIENTATION MEASUREMENTS;

CRYSTALLOGRAPHY;

EID: 34547502096     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-007-9226-2     Document Type: Article

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