Reflected image of a strongly focused spot

Optics Letters

Volumn 26, Issue 11, 2001, Pages 789-791

  Novotny, Lukas ^a   Grober, Robert D ^b   Karrai, Khaled ^c  

^a UNIVERSITY OF ROCHESTER   (United States)

^b Yale University   (United States)

^c UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSED SPOT;

DIELECTRIC MATERIALS; IMAGE ANALYSIS; INTERFACES (MATERIALS); OPTICAL INSTRUMENT LENSES; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; PHASE SHIFT;

LIGHT REFLECTION;

EID: 0009585190     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.26.000789     Document Type: Article

References (7)

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5. B. Hecht, B. Sick, and L. Novotny, Phys. Rev. Lett. 85, 4482 (2000).
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7. B. Richards and E. Wolf, Proc. R. Soc. London Ser. A 253, 358 (1959).