Valley polarization and susceptibility of composite fermions around a filling factor ν=32

Physical Review Letters

Volumn 98, Issue 26, 2007, Pages

  Bishop, N C ^a   Padmanabhan, M ^a   Vakili, K ^a   Shkolnikov, Y P ^a,b   De Poortere, E P ^a,c   Shayegan, M ^a  

^a Princeton University   (United States)

^b EXPONENT INC   (United States)

^c Och Spine at New York Presbyterian Hospitals   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGREES OF FREEDOM (MECHANICS); GALVANOMAGNETIC EFFECTS; MAGNETIC SUSCEPTIBILITY; QUANTUM THEORY; SPIN POLARIZATION;

FILLING FACTOR; FRACTIONAL QUANTUM HALL STATES; MAGNETOTRANSPORT MEASUREMENTS; QUASIPARTICLES;

FERMIONS;

EID: 34547322081     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.98.266404     Document Type: Article

References (20)

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15. To draw the fan diagram of Fig. 3 at zero strain, we need to know the ratio of the Zeeman and cyclotron energies; this ratio is equal to 2m0 times the product of the effective g factor and cyclotron effective mass. In our system, the band value for the cyclotron effective mass is mb=(m mt)1/2 where m =1.1m0 and mt=0.21m0 are the longitudinal and transverse effective masses, m0 is the free electron mass. The band g factor is 2. These parameters become enhanced due to interaction; we denote the enhanced values as g* and m*.
16. Coincidence measurements in tilted magnetic fields indicate a product g*m*=2.2×gbmb for our system [Y.P. Shkolnikov, Phys. Rev. Lett. 92, 246804 (2004)]. PRLTAO 0031-9007 10.1103/PhysRevLett.92.246804
17. Similar to the case of spin described in the previous reference, we need to know the ratio of the valley splitting and cyclotron energies to draw the fan diagram in Fig. 3 at finite values of strain; this ratio is equal to times the product of the effective conduction band deformation potential and cyclotron effective mass. The band value of the conduction band deformation potential E2,b is 5.8 eV [S. Charbonneau, Phys. Rev. B PRBMDO 0163-1829 44, 8312 (1991)], the cyclotron mass is discussed in the previous reference. These parameters are also renormalized due to interaction; we denote the enhanced values as E2* and m*. 10.1103/PhysRevB.44.8312
18. Coincidence measurements as a function of applied strain indicate a product E2*m*=1.7×E2,bmb for the electrons in our system.
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