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Surface Science

Volumn 507-510, Issue , 2002, Pages 357-361

Roughening aspects of room temperature vapor deposited oligomer thin films onto Si substrates

(3) Palasantzas, G a Tsamouras, D a De Hosson, J Th M a

a UNIVERSITY OF GRONINGEN (Netherlands)

Author keywords

Growth; Silicon; Surface roughening

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIFFUSION; OLIGOMERS; OPTOELECTRONIC DEVICES; SEMICONDUCTING SILICON; SUBSTRATES; THIN FILMS; VAPOR DEPOSITION;

PHOTONIC DEVICES;

SURFACE ROUGHNESS;

EID: 0036609198 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(02)01271-2 Document Type: Conference Paper

Times cited : (19)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.