CMOS pixel-level ADC with change detection

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2006, Pages 1647-1650

  Chi, Yu M ^a   Mallik, Udayan ^a   Choi, Edward ^a   Clapp, Matthew ^a   Gauwenberghs, Gert ^a   Etienne Cummings, Ralph ^a  

^a Whiting School of Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE PIXEL SENSORS; CHANGE DETECTION; PIXEL TEMPORAL INTENSITY; SURVEILLANCE NETWORK APPLICATIONS;

ANALOG TO DIGITAL CONVERSION; BANDWIDTH; COMPARATOR CIRCUITS; ELECTRIC NETWORK ANALYSIS; INTEGRATED CIRCUITS; LIGHT AMPLIFIERS; PIXELS; SENSORS;

CMOS INTEGRATED CIRCUITS;

EID: 34547295036     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. U. Mallik, M. Clapp, E. Choi, G. Cauwenberghs and R. Etienne-Cummings, "Temporal Threshold Change Detection Imager," ISSCC Dig. Tech. Papers, February 2005.
2. D. Yang, B. Fowler and A. El-Gamal, "A Nyquist-Rate Pixel-Level ADC for CMOS Imager Sensors," IEEE J. Solid State Circuits, vol 34. pp. 348-356, March, 1999.
3. O. Yadid-Pecht and E. Fossum, "Wide Dynamic Range CMOS APS Using Dual Sampling," IEEE Trans. Electron Devices, vol 44. pp. 1721-1723, October 1997.
4. O. Yadid-Pecht and A. Belenky, "In-Pixel Autoexposure CMOS APS," IEEE J. Solid State Circuits, vol 38. pp. 1425-1428, August 2003.
5. Q.Lui and J.G. Harris, "A time-to-first-spike CMOS imager," ISCAS 2004, vol 4. pp. 840-843.
6. D. Yang, A. El-Gamal, B. Fowler and Hui Tian, "A 640 × 512 CMOS image sensor with ultrawide dynamic range floating-point pixel-level ADC," IEEE J. Solid State Circuits, vol 34, pp. 704-711, May 1999.