Temporal change threshold detection imager

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn 48, Issue , 2005, Pages

  Mallik, Udayan ^a   Clapp, Matthew ^a   Choi, Edward ^a   Cauwenberghs, Gert ^a   Etienne Cummings, Ralph ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 28144431648     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. D. Yang, B. Fowler and A. El-Gamal, "A Nyquist-Rate Pixel-Level ADC for CMOS Image Sensors," IEEE J. Solid-State Circuits, vol. 34 (3), pp. 348-356, March, 1999.
2. J. Kramer, "An On/off Transient Imager with Event-Driven, Asynchronous Readout," IEEE ISCAS, vol. II, pp 165-168, May, 2002.
3. T. Delbrück, C. Mead, "An Electronic Photoreceptor Sensitive to Small Changes in Intensity," Adv. Neural Information Processing Systems 1, D.S. Touretzky, Ed., Morgan Kaufman, San Mateo CA, pp. 720-726, 1989.
4. V. Gruev, R. Etienne-Cummings, "A Pipelined Temporal Difference Imager," IEEE J. Solid State Circuits, vol. 39 (3), pp. 538-543, March, 2004.
5. A. Dickinson et al., "A 256×256 CMOS Active Pixel Image Sensor with Motion Detection," ISSCC Dig. Tech. Papers pp. 226-227, Feb., 1995.