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Volumn 90, Issue 25, 2007, Pages

In situ Ni-Si nanowire junction based on substrate sourced growth and its electrical transport behavior

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRIC CURRENT CARRYING CAPACITY (CABLES); ELECTRON TRANSPORT PROPERTIES; POLYCRYSTALLINE MATERIALS; SEMICONDUCTOR GROWTH; SEMICONDUCTOR JUNCTIONS;

EID: 34547279697     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2750522     Document Type: Article
Times cited : (1)

References (23)
  • 19
    • 20844462867 scopus 로고    scopus 로고
    • Yun-Hi Lee, Y. T. Chang, and B. K. Ju, Appl. Phys. Lett. 86, 173103 (2005).
    • Yun-Hi Lee, Y. T. Chang, and B. K. Ju, Appl. Phys. Lett. 86, 173103 (2005).
  • 20
    • 79955994288 scopus 로고    scopus 로고
    • Yun-Hi Lee, Y. T. Jang, C. H. Choi, and B. K. Ju, Appl. Phys. Lett. 81, 745 (2002).
    • Yun-Hi Lee, Y. T. Jang, C. H. Choi, and B. K. Ju, Appl. Phys. Lett. 81, 745 (2002).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.