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Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 75, Issue 6, 2007, Pages

X-ray and ellipsometric study of strong critical adsorption

(7) Brown, M D a Law, B M a Marchand, L b Lurio, L B b Kuzmenko, I c Gog, T c Hamilton, W A d

a KANSAS STATE UNIVERSITY (United States)

b NORTHERN ILLINOIS UNIVERSITY (United States)

c ARGONNE NATIONAL LABORATORY (United States)

d AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ELLIPSOMETRY; MATHEMATICAL MODELS; REFLECTOMETERS; SURFACE PHENOMENA; X RAYS;

ELLIPSOMETRIC CRITICAL ADSORPTION DATA; ELLIPSOMETRIC DATA; LIQUID-VAPOR INTERFACE; TEMPERATURE DEPENDENCE;

INTERFACES (MATERIALS);

EID: 34547275095 PISSN: 15393755 EISSN: 15502376 Source Type: Journal
DOI: 10.1103/PhysRevE.75.061606 Document Type: Article

Times cited : (4)

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