X-ray specular reflectivity study of a critical binary fluid mixture

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 72, Issue 1, 2005, Pages

  Marschand, L W ^a   Brown, M ^b   Lurio, L B ^a   Law, B M ^b   Uran, S ^b   Kuzmenko, I ^c   Gog, T ^c  

^a NORTHERN ILLINOIS UNIVERSITY   (United States)

^b KANSAS STATE UNIVERSITY   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIQUID-VAPOR INTERFACE COMPOSITION PROFILE; TETRABROMOETHANE; X-RAY REFLECTIVITY;

BINARY MIXTURES; COMPOSITION; FLUIDS; MONOLAYERS; REFLECTION;

X RAY ANALYSIS;

EID: 27244447196     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.72.011509     Document Type: Article

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