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Volumn , Issue , 2006, Pages 205-208

An integrated flow from pre-silicon simulation to post-silicon verification

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; COMPUTER SIMULATION; COST REDUCTION; DESIGN FOR TESTABILITY; OPTICAL SENSORS; RELIABILITY THEORY; SIGNAL ANALYSIS;

EID: 34547247030     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (12)
  • 1
    • 84943537852 scopus 로고    scopus 로고
    • An integrated tool for analog test generation and fault simulation
    • Pages
    • Ozev, S.; Orailoglu, Á., "An integrated tool for analog test generation and fault simulation", Quality Electronic Design, 2002 Pages:267-272
    • (2002) Quality Electronic Design , pp. 267-272
    • Ozev, S.1    Orailoglu, A.2
  • 2
    • 84863727100 scopus 로고    scopus 로고
    • DD measurements for the detection of parametric and catastrophic faults, DATE98 Pages: 822-827
    • DD measurements for the detection of parametric and catastrophic faults", DATE98 Pages: 822-827
  • 3
    • 0348040171 scopus 로고    scopus 로고
    • TAM optimization for mixed-signal SOCs using analog test wrappers
    • Pages
    • Sehgal, A.; Ozev, S.; Chakrabarty, K., "TAM optimization for mixed-signal SOCs using analog test wrappers. ICCAD-2003. Pages:95-99
    • (2003) ICCAD , pp. 95-99
    • Sehgal, A.1    Ozev, S.2    Chakrabarty, K.3
  • 4
    • 33646919808 scopus 로고    scopus 로고
    • Sehgal, A.; Liu, F.; Ozev, S.: Chakrabarty, K., Test planning for mixed-signal SOCs with wrapped analog cores, DATE05. Pages:50-55 1
    • Sehgal, A.; Liu, F.; Ozev, S.: Chakrabarty, K., "Test planning for mixed-signal SOCs with wrapped analog cores", DATE05. Pages:50-55 Vol. 1
  • 5
    • 0036445984 scopus 로고    scopus 로고
    • Across the great divide: Examination of simulation data with actual silicon waveforms improves device characterization and production test development
    • Pages
    • Austin, T.; Canlas, C.; Morgan, B.; Rodriguez. J.L., "Across the great divide: examination of simulation data with actual silicon waveforms improves device characterization and production test development", Test 2002 Pages:270-279
    • (2002) Test , pp. 270-279
    • Austin, T.1    Canlas, C.2    Morgan, B.3    Rodriguez, J.L.4
  • 6
    • 34547262405 scopus 로고    scopus 로고
    • IEEE Computer Society. IEEE Standard VHDL Analog and Mixed-Signal Extensions, IEEE Std 1076.1-1999. Design Automation Standards Committee of the IEEE Computer Society, 1999.
    • IEEE Computer Society. "IEEE Standard VHDL Analog and Mixed-Signal Extensions", IEEE Std 1076.1-1999. Design Automation Standards Committee of the IEEE Computer Society, 1999.
  • 7
    • 34547359681 scopus 로고    scopus 로고
    • http://www.ni.com/labview/
  • 8
    • 0003500979 scopus 로고
    • Kluwer Academic Publischers, Massachussets
    • K. Parker, "The Boundary-Scan Handbook", Kluwer Academic Publischers, Massachussets. 1992.
    • (1992) The Boundary-Scan Handbook
    • Parker, K.1
  • 9
    • 0030655538 scopus 로고    scopus 로고
    • Improving The Testability Of Mixed-Signal Integrated Circuits
    • Pages
    • Gordon W. Roberts. "Improving The Testability Of Mixed-Signal Integrated Circuits" IEEE Custom Integrated Circuit Conference 1997. Pages:214-221
    • (1997) IEEE Custom Integrated Circuit Conference , pp. 214-221
    • Roberts, G.W.1
  • 10
    • 33750324218 scopus 로고    scopus 로고
    • C. Marino. M. Forliti, A. Rocchi, A. Giambastiani, F. Iozzi, M. De Marinis. L. Fanucci. Mixed signal behavioural verification using vhdl-ams 2005 PhD Research in Microelectronics and Electronics, Pages: 315-318 2.
    • C. Marino. M. Forliti, A. Rocchi, A. Giambastiani, F. Iozzi, M. De Marinis. L. Fanucci. "Mixed signal behavioural verification using vhdl-ams" 2005 PhD Research in Microelectronics and Electronics, Pages: 315-318 Vol. 2.
  • 12
    • 34547277284 scopus 로고    scopus 로고
    • http://www.gaisler.com/


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.