Effect of process conditions on microstructure and performance of thermally evaporated InSb thin films

Indian Journal of Engineering and Materials Sciences

Volumn 14, Issue 1, 2007, Pages 55-63

  Singh, Sukhvir ^a   Lal, Kasturi ^a   Srivastava, A K ^a   Sood, K N ^a   Kishore, Ram ^a  

^a NATIONAL PHYSICAL LABORATORY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION METHODS; DIFFERENT SUBSTRATES; ELECTRICAL RESISTIVITY MEASUREMENTS; FOURIER TRANSFORM INFRARED SPECTROMETRY; INDIUM ANTIMONIDE (INSB); SCANNING AND TRANSMISSION ELECTRON MICROSCOPY; STRUCTURE AND MICROSTRUCTURES; THERMAL EVAPORATION TECHNIQUE;

EPITAXIAL FILMS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MICROSTRUCTURE; QUARTZ; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

INDIUM ANTIMONIDES;

EID: 34547238352     PISSN: 09714588     EISSN: 09751017     Source Type: Journal    
DOI: None     Document Type: Article

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