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Volumn , Issue , 2006, Pages 630-635
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FLAW: FPGA lifetime awareness
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Author keywords
Electromigration; FPGA; Hot carrier effects; Time dependent dielecric breakdown
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Indexed keywords
ELECTRIC BREAKDOWN;
ELECTROMIGRATION;
FAILURE ANALYSIS;
HOT CARRIERS;
VLSI CIRCUITS;
ERROR SUSCEPTIBILITY;
HOT CARRIER EFFECTS;
PERFORMANCE DEGRADATION;
TIME DEPENDENT DIELECRIC BREAKDOWN;
FIELD PROGRAMMABLE GATE ARRAYS (FPGA);
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EID: 34547225235
PISSN: 0738100X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1145/1146909.1147070 Document Type: Conference Paper |
Times cited : (39)
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References (16)
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