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Volumn , Issue , 2006, Pages 630-635

FLAW: FPGA lifetime awareness

Author keywords

Electromigration; FPGA; Hot carrier effects; Time dependent dielecric breakdown

Indexed keywords

ELECTRIC BREAKDOWN; ELECTROMIGRATION; FAILURE ANALYSIS; HOT CARRIERS; VLSI CIRCUITS;

EID: 34547225235     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1146909.1147070     Document Type: Conference Paper
Times cited : (39)

References (16)
  • 4
    • 0036508455 scopus 로고    scopus 로고
    • Reliability limits for the Gate Insulator in CMOS Technology
    • J. H. Stathis "Reliability limits for the Gate Insulator in CMOS Technology" In IBM journal of R&D, Vol. 46, 2002.
    • (2002) IBM journal of R&D , vol.46
    • Stathis, J.H.1
  • 9
    • 85165848086 scopus 로고    scopus 로고
    • www.xilinx.com
    • Xilinx product datasheet for Virtex-II
    • "www.xilinx.com," Xilinx product datasheet for Virtex-II.
  • 11
    • 13944251955 scopus 로고    scopus 로고
    • Critical Reliability Challenges for the International Technology Roadmap for Semiconductors
    • "Critical Reliability Challenges for the International Technology Roadmap for Semiconductors" In International Sematech Technology transfer 03024377A-TR, 2003.
    • (2003) International Sematech Technology transfer 03024377A-TR
  • 14
    • 85165859823 scopus 로고    scopus 로고
    • BPTM 65nm: Berkeley Predictive Technology Model
    • "BPTM 65nm: Berkeley Predictive Technology Model."


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.