A closed form solution for the pull-in voltage of the micro bridge

Tamkang Journal of Science and Engineering

Volumn 10, Issue 2, 2007, Pages 147-150

  Hu, Yuh Chung ^a   Lee, Guan De ^a  

^a HUAFAN UNIVERSITY   (Taiwan)

Author keywords

Electrostatic; Fringing field; MEMS; Pull in voltage

Indexed keywords

ELECTRIC LOADS; EULER EQUATIONS; MEMS; STRESS ANALYSIS; VOLTAGE MEASUREMENT;

ELECTROSTATIC LOADS; FRINGING FIELDS; INITIAL STRESS; PULL-IN VOLTAGES;

ELECTRIC FIELDS;

EID: 34547163841     PISSN: 15606686     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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