Timing-based delay test for screening small delay defects

Proceedings - Design Automation Conference

Volumn , Issue , 2006, Pages 320-325

  Ahmed, Nisar ^a   Tehranipoor, Mohammad ^a   Jayaram, Vinay ^b  

^a Baltimore County   (United States)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

Delay testing; Test generation

Indexed keywords

DELAY CONTROL SYSTEMS; FLIP FLOP CIRCUITS; TIME DELAY; TIMING CIRCUITS;

DELAY DEFECTS; DELAY TESTING; TEST GENERATION;

INTEGRATED CIRCUIT TESTING;

EID: 34547159409     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1146909.1146993     Document Type: Conference Paper

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