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Volumn 52, Issue 15, 2007, Pages

Implementation and validation of portal dosimetry with an amorphous silicon EPID in the energy range from 6 to 25 MV

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; IONIZATION CHAMBERS; NORMAL DISTRIBUTION; SCATTERING;

EID: 34547115940     PISSN: 00319155     EISSN: 13616560     Source Type: Journal    
DOI: 10.1088/0031-9155/52/15/N05     Document Type: Article
Times cited : (24)

References (27)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.