Polarization switching in BaTiO3 thin films measured by X-ray diffraction exploiting anomalous dispersion

Journal of Applied Crystallography

Volumn 37, Issue 2, 2004, Pages 193-199

  Van Reeuwijk, S J ^a   Karakaya, K ^a   Graafsma, H ^b   Harkema, S ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM; STRONTIUM; TITANIUM DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; DISPERSION; ELECTRIC FIELD; FILM; POLARIZATION; SURFACE PROPERTY; SYNCHROTRON RADIATION; THICKNESS; X RAY ANALYSIS; X RAY DIFFRACTION;

EID: 3442899922     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889803028395     Document Type: Article

References (23)

1. Abrahams, S. C. (1994). Acta Cryst. A50, 658-685.
2. Ahn, C. H., Tybell, T., Antognazza, L., Char, K., Hammond, R. H., Beasley, M. R., Fischer, Ø. & Triscone, J.-M. (1997). Science, 276, 1100-1103.
3. Auciello, O., Scott, J. F. & Ramesh, R. (1998). Phys. Today. 51, 22-27.
4. Barabash, R. I., Donner, W. & Dosch, H. (2001). Appl. Phys. Lett. 78, 443-445.
5. Colla, E. L., Hong, S., Taylor, D. V., Tagantsev, A. K., Setter, N. & No, K. (1998). Appl. Phys. Lett. 72, 2763-2765.
6. Gruverman, A., Auciello, O. & Tokumoto, H. (1996). Appl. Phys. Lett. 69, 3191-3193.
7. Harada, J., Pedersen, T. & Barnea, Z. (1970). Acta Cryst. A26, 336-344.
8. Hong, S., Colla, E. L., Kim, E., Taylor, D. V., Tagantsev, A. K., Muralt, P. & Setter, N. (1999). J. Appl. Phys. 86, 607-613.
9. Jona, F. & Shirane, G. (1962). Ferroelectric Crystals. Oxford: Pergamon Press.
10. Krivoglaz, M. A. (1996). X-ray and Neutron Diffraction in Nonideal Crystals. Berlin: Springer-Verlag.
11. Lee, K. S., Kim, Y. K. & Baik, S. (2001). Appl. Phys. Lett. 79, 2444-2446.
12. Li, C. L., Chen, Z. H., Zhou, Y. L. & Ciu, D. F. (2001). J. Phys. Condens. Matter, 13, 5261-5268.
13. Li, C. L., Cui, D. F., Zhou, Y. L., Lu, H. B., Chen, Z. H., Zhang, D. F. & Wu, F. (1998). Appl. Surf. Sci. 136, 173-177.
14. Marasco, D. L., Kazimirov, A., Bedzyk, M. J., Lee, T.-L., Streiffer, S. K., Auciello, O. & Bai, G.-R. (2001). Appl. Phys. Lett. 79, 515-517.
15. Miceli, P. F., & Palmstrłm, C. J. (1995). Phys. Rev. B, 51, 5506-5509.
16. Miceli, P. F., Weatherwax, J., Krentsel, T. & Palmstrłm, C. J. (1996). Physica B, 221, 230-234.
17. Okaya, Y., Pepinsky, R. & Unterleitner, F. (1959). Bull. Am. Phys. Soc. Ser. II, 4, 62-67.
18. Paturle, A., Graafsma, H., Sheu, H.-S., Coppens, P. & Becker, P. (1991). Phys. Rev. B, 43, 14683-14691.
19. Reeuwijk, S. J. van, Puig-Molina, A. & Graafsma, H. (2000). Phys. Rev. B, 62, 6192-6197.
20. Ramesh, R., Aggarwal, S. & Auciello, O., (2001). Mater. Sci. Eng. R, 32, 191-236.
21. Thompson, C., Foster, C. M., Eastman, J. A. & Stephenson. G. B. (1997). Appl. Phys. Lett. 71, 3516-3518.
22. Thompson, C., Munkholm, A., Streiffer, S. K., Stephenson, G. B., Ghosh, K., Eastman, J. A., Auciello, O., Bai, G.-R., Lee, M. K. & Eom, C. B. (2001). Appl. Phys. Lett. 78. 3511-3513.
23. Zhao, T., Chen, F., Lu, H. B., Yang, G. Z. & Chen, Z. H. (2000). J. Appl. Phys. 87, 7442-7447.