Electrical approach to defect depth estimation by stepped infrared thermography

IEE Proceedings: Science, Measurement and Technology

Volumn 151, Issue 4, 2004, Pages 298-304

  Gupta, R ^a   Tuli, S ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; ELECTRIC NETWORK ANALYSIS; HEATING; LADDER NETWORKS; LAPLACE TRANSFORMS; MATHEMATICAL MODELS; NONDESTRUCTIVE EXAMINATION; SURFACE TESTING; THERMODYNAMIC PROPERTIES; THERMOGRAPHY (TEMPERATURE MEASUREMENT);

DEFECT DEPTH ESTIMATION; ELECTRICAL MODELLING; SEMI INFINITE MATERIAL; SURFACE EMISSIVITY; SURFACE TEMPERATURE EVOLUTION; THERMALLY ANISOTROPIC MATERIAL;

THERMOGRAPHY (IMAGING);

EID: 3442895042     PISSN: 13502344     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-smt:20040564     Document Type: Article

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