Measuring defect depths by thermal-wave imaging

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2766, Issue , 1996, Pages 236-239

  Favro, Lawrence D ^a   Han, Xiaoyan ^a   Kuo, Pao K ^a   Thomas, Robert L ^a  

^a WAYNE STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT DEPTHS; THERMAL WAVE IMAGING;

BOUNDARY CONDITIONS; DEFECTS; NONDESTRUCTIVE EXAMINATION;

THERMAL IMAGING;

EID: 0029714727     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)