A new method to detect an X-ray diffracted beam at an angle of 90°

Journal of Applied Crystallography

Volumn 37, Issue 3, 2004, Pages 451-454

  Hönnicke, Marcelo Goncalves ^a   Kakuno, Edson Massayuki ^a   Cusatis, Cesar ^a   Mazzaro, Irineu ^a  

^a FEDERAL UNIVERSITY OF PARANÁ   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; CRYSTAL STRUCTURE; DISPERSION; LASER; MOLECULAR INTERACTION; PHOTON; SEMICONDUCTOR; TEMPERATURE; X RAY DIFFRACTION;

EID: 3442890879     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889804007423     Document Type: Article

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