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Volumn 40, Issue 4, 2004, Pages 1025-1030

Voltage-balancing method for IGBTs connected in series

Author keywords

[No Author keywords available]

Indexed keywords

GATES (TRANSISTOR); INTEGRATED CIRCUIT LAYOUT; SEMICONDUCTOR DEVICE MODELS; VOLTAGE CONTROL;

EID: 3442877238     PISSN: 00939994     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIA.2004.830794     Document Type: Article
Times cited : (133)

References (6)
  • 1
    • 3442899530 scopus 로고    scopus 로고
    • Switching test of flat-pack IGBT's connected in series
    • Y. Abe, "Switching test of flat-pack IGBT's connected in series," in Proc. JIASC, 1999, pp. 119-120.
    • (1999) Proc. JIASC , pp. 119-120
    • Abe, Y.1
  • 2
    • 3442901551 scopus 로고    scopus 로고
    • Improvement method for unbalanced voltage of IGBT's connected in series
    • Y. Abe, "Improvement method for unbalanced voltage of IGBT's connected in series," Trans. Inst. Elect. Eng. Jpn., no. 4-002, p. 1025, 2001.
    • (2001) Trans. Inst. Elect. Eng. Jpn. , Issue.4 , pp. 1025
    • Abe, Y.1
  • 6
    • 0031640930 scopus 로고    scopus 로고
    • Ruggedness and reliability of the 2.5 kV-1.8 kA power pack IGBT with a novel multi-collector structure
    • T. Koga, K. Yamazaki, H. Wakamoto, Y. Takahashi, and Y. Seki, "Ruggedness and reliability of the 2.5 kV-1.8 kA power pack IGBT with a novel multi-collector structure," in Proc. ISPSD'98, 1998, pp. 437-440.
    • (1998) Proc. ISPSD'98 , pp. 437-440
    • Koga, T.1    Yamazaki, K.2    Wakamoto, H.3    Takahashi, Y.4    Seki, Y.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.