Ruggedness and reliability of the 2.5 kV-1.8 kA power pack IGBT with a novel multi-collector structure

IEEE International Symposium on Power Semiconductor Devices & ICs (ISPSD)

Volumn , Issue , 1998, Pages 437-440

  Koga, Takeharu ^a   Yamazaki, Kazuaki ^a   Wakimoto, Hiroki ^a   Takahashi, Yoshikazu ^a   Kirihata, Humiaki ^a   Seki, Yasukazu ^a  

^a FUJI ELECTRIC CO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT COLLECTORS; POWER ELECTRONICS; THERMAL CYCLING; THERMAL STRESS;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT); MULTI-COLLECTOR STRUCTURE;

BIPOLAR TRANSISTORS;

EID: 0031640930     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)