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Journal of Materials Science: Materials in Electronics

Volumn 18, Issue 9, 2007, Pages 973-976

Fabrication and characterization of epitaxial Ba 0.6 Sr 0.4TiO 3/LaNiO 3 heterostructures

(8) Qin, W F a Xiong, J a Zhu, J a Tang, J L a Jie, W J a Wei, X H a Zhang, Y a Li, Y R a

a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA (China)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE-VOLTAGE CURVES; ROOT-MEAN-SQUARE;

CAPACITANCE; CHARACTERIZATION; CURRENT VOLTAGE CHARACTERISTICS; EPITAXIAL FILMS; FABRICATION; GRAIN SIZE AND SHAPE; HETEROJUNCTIONS; LEAKAGE CURRENTS; METALLOGRAPHIC MICROSTRUCTURE; PERMITTIVITY; PULSED LASER DEPOSITION; SURFACE MORPHOLOGY;

BARIUM COMPOUNDS;

EID: 34347336661 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-007-9150-7 Document Type: Article

Times cited : (7)

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