Admittance and dielectric spectroscopy of polycrystalline semiconductors

Journal of the European Ceramic Society

Volumn 27, Issue 13-15, 2007, Pages 4313-4320

  Bueno, Paulo R ^a   Varela, José A ^a   Longo, Elson ^a  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

Author keywords

Impedance spectroscopy; Varistor

Indexed keywords

ANNEALING; CAPACITANCE; DIELECTRIC SPECTROSCOPY; ELECTRIC ADMITTANCE; ELECTRIC CONDUCTANCE; FREQUENCY RESPONSE; GRAIN BOUNDARIES; VARISTORS;

IMPEDANCE SPECTRA ANALYSIS; MULTI-JUNCTION DEVICE; POLYCRYSTALLINE SEMICONDUCTORS;

POLYCRYSTALLINE MATERIALS;

ANNEALING; CAPACITANCE; DIELECTRIC SPECTROSCOPY; ELECTRIC ADMITTANCE; ELECTRIC CONDUCTANCE; FREQUENCY RESPONSE; GRAIN BOUNDARIES; POLYCRYSTALLINE MATERIALS; VARISTORS;

EID: 34347324023     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2007.02.155     Document Type: Article

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