Effect of trap density on the dielectric response of varistor ceramics

Solid-State Electronics

Volumn 43, Issue 12, 1999, Pages 2123-2127

  Garcia Belmonte, G ^a   Bisquert, J ^a   Fabregat Santiago, F ^a  

^a UNIVERSITAT JAUME I   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CURRENT DENSITY; ELECTRON TRAPS; GRAIN BOUNDARIES; SEMICONDUCTOR JUNCTIONS;

VARISTOR CERAMICS;

VARISTORS;

EID: 0033284692     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(99)00201-4     Document Type: Article

References (23)

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