Electrostatic force microscopy as a tool to estimate the number of active potential barriers in dense non-Ohmic polycrystalline SnO2 devices

Applied Physics Letters

Volumn 89, Issue 15, 2006, Pages

  Vasconcelos, J S ^a   Vasconcelos, N S L S ^a   Orlandi, M O ^b   Bueno, P R ^b   Varela, J A ^b   Longo, E ^b   Barrado, C M ^c   Leite, E R ^c  

^a FEDERAL INSTITUTE OF EDUCATION   (Brazil)

^b SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^c FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC FORCE MICROSCOPY (EFM); METAL OXIDES; POLYCRYSTALLINE VARISTORS; POTENTIAL BARRIERS;

ELECTROSTATICS; GRAIN BOUNDARIES; MICROSCOPIC EXAMINATION; SEMICONDUCTING TIN COMPOUNDS; VARISTORS;

POLYCRYSTALLINE MATERIALS;

EID: 33750002287     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2354483     Document Type: Article

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