SCOPUS 정보 검색 플랫폼

Volumn 957, Issue , 2007, Pages 23-28

Temperature dependent hall measurements on PLD thin films

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; HALL EFFECT; PARTIAL PRESSURE; PULSED LASER DEPOSITION; SAPPHIRE; SUBSTRATES; THERMAL EFFECTS; ZINC OXIDE;

COMPENSATING ACCEPTORS; HALL DATA; HALL MEASUREMENT;

THIN FILMS;

EID: 34250809080 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (10)

References (14)

1
- 0035932264
- D.C. Look, Materials Science and Engineering B80, 383 (2001).
- (2001) Materials Science and Engineering , vol.B80 , pp. 383
- Look, D.C.¹

2
- 29344440493
- O. Schmidt, A. Geis, P. Kiesel, C.G. Van de Walle, N.M. Johnson, A. Bakin, A. Waag, G.H. Döhler, Superlattices and Microstructures 39, 8 (2005).
- (2005) Superlattices and Microstructures , vol.39 , pp. 8
- Schmidt, O.¹ Geis, A.² Kiesel, P.³ Van de Walle, C.G.⁴ Johnson, N.M.⁵ Bakin, A.⁶ Waag, A.⁷ Döhler, G.H.⁸

3
- 33644542716
- D.C. Look, H.L. Mosbacker, Y.M. Strzhemechny, L.J. Brillson, Superlattices and Microstructures 38, 406 (2005).
- (2005) Superlattices and Microstructures , vol.38 , pp. 406
- Look, D.C.¹ Mosbacker, H.L.² Strzhemechny, Y.M.³ Brillson, L.J.⁴

4
- 0037277330
- D. C. Look, R. L. Jones, J. R. Sizelove, N. Y. Garces, N. C. Giles, and L. E. Halliburton, phys. stat. sol. (a) 195, 171 (2003).
- (2003) phys. stat. sol. (a) , vol.195 , pp. 171
- Look, D.C.¹ Jones, R.L.² Sizelove, J.R.³ Garces, N.Y.⁴ Giles, N.C.⁵ Halliburton, L.E.⁶

5
- 2442472178
- D. C. Reynolds, C. W. Litton, D. C. Look, J. E. Hoelscher, B. Claflin, T. C. Collins, J. Nause, and B. Nemeth, J. Appl. Phys. 95, 4802 (2004).
- (2004) J. Appl. Phys , vol.95 , pp. 4802
- Reynolds, D.C.¹ Litton, C.W.² Look, D.C.³ Hoelscher, J.E.⁴ Claflin, B.⁵ Collins, T.C.⁶ Nause, J.⁷ Nemeth, B.⁸

6
- 3042743999
- H. Tampo, A. Yamada, P. Fons, H. Shibata, K. Matsubara, K. Iwata, and S. Niki, K. Nakahara and H. Takasu, Appl. Phys. Lett. 84, 4412 (2004).
- (2004) Appl. Phys. Lett , vol.84 , pp. 4412
- Tampo, H.¹ Yamada, A.² Fons, P.³ Shibata, H.⁴ Matsubara, K.⁵ Iwata, K.⁶ Niki, S.⁷ Nakahara, K.⁸ Takasu, H.⁹

7
- 2342521249
- Y.M. Strzhemechny, H. L. Mosbacker, D.C. Look, D.C. Reynolds, C.W. Litton, N.Y. Garces, N.C. Giles, LE. Halliburton, S. Niki, and L.J. Brillson Appl. Phys. Lett. 84, 2545 (2004).
- (2004) Appl. Phys. Lett , vol.84 , pp. 2545
- Strzhemechny, Y.M.¹ Mosbacker, H.L.² Look, D.C.³ Reynolds, D.C.⁴ Litton, C.W.⁵ Garces, N.Y.⁶ Giles, N.C.⁷ Halliburton, L.E.⁸ Niki, S.⁹ Brillson, L.J.¹⁰

8
- 0000926633
- D. C. Look and J. R. Sizelove, Phys. Rev. Lett. 82, 1237 (1999).
- (1999) Phys. Rev. Lett , vol.82 , pp. 1237
- Look, D.C.¹ Sizelove, J.R.²

9
- 36149009161
- R. L. Petritz, Phys. Rev. 104, 1508 (1956),
- (1956) Phys. Rev , vol.104 , pp. 1508
- Petritz, R.L.¹

10
- 0040771894
- 1263
- J. W. Orton and M. J. Powell, Reports on Progress in Physics 43, 1263 (1980).
- (1980) Reports on Progress in Physics , vol.43
- Orton, J.W.¹ Powell, M.J.²

11
- 0003624373
- Springer-Verlag, Berlin, chapter 6
- K. Seeger, Semiconductor Physics (Springer-Verlag, Berlin, 1999), chapter 6.
- (1999) Semiconductor Physics
- Seeger, K.¹

12
- 79955988169
- F. D. Auret, S. A. Goodman, M. J. Legodi, W. E. Meyer, and D. C. Look, Appl. Phys. Lett. 80, 1340 (2002).
- (2002) Appl. Phys. Lett , vol.80 , pp. 1340
- Auret, F.D.¹ Goodman, S.A.² Legodi, M.J.³ Meyer, W.E.⁴ Look, D.C.⁵

13
- 33644941268
- F. Tuomisto, K. Saarinen, D. C. Look, and G. C. Farlow, Phys. Rev. B 72, 085206 (2005).
- (2005) Phys. Rev. B , vol.72 , pp. 085206
- Tuomisto, F.¹ Saarinen, K.² Look, D.C.³ Farlow, G.C.⁴

14
- 36149018861
- A. R. Hutson, Phys. Rev. 108, 222 (1957).
- (1957) Phys. Rev , vol.108 , pp. 222
- Hutson, A.R.¹

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