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Volumn 14, Issue 3, 2007, Pages 286-289

Effect of Pd ions in the chemical etching solution

Author keywords

ABS plastic; AFM; etching; palladium; XPS

Indexed keywords

ATOMIC FORCE MICROSCOPY; ETCHING; PALLADIUM; SULFURIC ACID; SURFACE ROUGHNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 34250734520     PISSN: 10058850     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1005-8850(07)60055-3     Document Type: Article
Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.