The effect of annealing on vacuum-evaporated copper selenide and indium telluride thin films

Materials Characterization

Volumn 58, Issue 8-9 SPEC. ISS., 2007, Pages 756-764

  Peranantham, P ^a   Jeyachandran, Y L ^a   Viswanathan, C ^a   Praveena, N N ^a   Chitra, P C ^a   Mangalaraj, D ^a   Narayandass, Sa K ^a  

^a BHARATHIAR UNIVERSITY   (India)

Author keywords

Copper selenide; Indium telluride; Metal chalcogenide

Indexed keywords

ANNEALING; CHALCOGENIDES; INDIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; VACUUM EVAPORATION; X RAY DIFFRACTION ANALYSIS;

COMPOSITIONAL ANALYSIS; COPPER SELENIDE; INDIUM TELLURIDE;

THIN FILMS;

EID: 34250635014     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2006.11.019     Document Type: Article

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