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Volumn , Issue , 2006, Pages 1456-1459

A novel active differential/common-mode load for true mixed-mode load-pull systems

Author keywords

Differential amplifiers; Load pull; Microwave measurements; Multiport circuits; Scattering parameters

Indexed keywords

ELECTRIC LOADS; MICROWAVE MEASUREMENT; REAL TIME SYSTEMS; SCATTERING PARAMETERS; TUNING;

EID: 34250363190     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2006.249564     Document Type: Conference Paper
Times cited : (9)

References (14)
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    • Dec
    • R. Mahmoudi, M. Spirito, P. Valk and J. L. Tauritz, "A novel load and source tuning system for balanced and unbalanced WCDMA power amplifers", in ARFTG Conference digest, Dec. 1999.
    • (1999) ARFTG Conference digest
    • Mahmoudi, R.1    Spirito, M.2    Valk, P.3    Tauritz, J.L.4
  • 9
    • 84954244399 scopus 로고    scopus 로고
    • A calibration procedure for on-wafer differential loadpull measurements
    • Philadelphia, PA, June
    • M. Spirito, M. P. van der Heijden, M. de Kok and L. C. N. de Vreede, "A calibration procedure for on-wafer differential loadpull measurements", in ARFTG Conference digest, Philadelphia, PA, June 2003, pp. 1-4.
    • (2003) ARFTG Conference digest , pp. 1-4
    • Spirito, M.1    van der Heijden, M.P.2    de Kok, M.3    de Vreede, L.C.N.4
  • 10
    • 34250307514 scopus 로고    scopus 로고
    • Focus Microwaves, Product note 75: DLPS, a differential load pull system, May 2003,http://www.focus-microwaves.com/.
    • Focus Microwaves, Product note 75: DLPS, a differential load pull system, May 2003,http://www.focus-microwaves.com/.
  • 11
    • 76849097096 scopus 로고    scopus 로고
    • Load-pull characterization system for differential devices
    • Dec
    • L. Wei and C. Tsironis, "Load-pull characterization system for differential devices", in ARFTG Conference digest, Dec. 2003, pp. 201-204.
    • (2003) ARFTG Conference digest , pp. 201-204
    • Wei, L.1    Tsironis, C.2
  • 12
    • 44049101380 scopus 로고    scopus 로고
    • Active load or source impedance synthesis apparatus for measurement test set of microwave components and systems
    • United States Patent n. 6509743, 12 June
    • A. Ferrero, Active load or source impedance synthesis apparatus for measurement test set of microwave components and systems, United States Patent n. 6509743, 12 June 2000.
    • (2000)
    • Ferrero, A.1
  • 13
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    • An improved calibration technique for on-wafer large-signal transistor characterization
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    • A. Ferrero and U. Pisani, "An improved calibration technique for on-wafer large-signal transistor characterization," IEEE Trans. Instrum. Meas., vol. IM-47, pp. 360-364, April 1993.
    • (1993) IEEE Trans. Instrum. Meas , vol.IM-47 , pp. 360-364
    • Ferrero, A.1    Pisani, U.2
  • 14
    • 4444227312 scopus 로고    scopus 로고
    • A study of injection locking and pulling in oscillators
    • Sept
    • B. Razavi, "A study of injection locking and pulling in oscillators", IEEE Journal of Solid State Circuits, vol. 39, n. 9, pp. 1415-1424, Sept. 2004.
    • (2004) IEEE Journal of Solid State Circuits , vol.39 , Issue.9 , pp. 1415-1424
    • Razavi, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.