Mixed-mode S-parameter characterization of differential structures

Proceedings of 5th Electronics Packaging Technology Conference, EPTC 2003

Volumn , Issue , 2003, Pages 533-537

  Fan, W ^a   Lu, A ^a   Wai, L L ^a   Lok, B K ^a  

^a SINGAPORE INSTITUTE OF MANUFACTURING TECHNOLOGY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYZERS; ELECTRONICS PACKAGING; LINEAR NETWORKS; PARAMETER ESTIMATION;

ACCURATE MEASUREMENT; COMMON MODE; DIFFERENTIAL MODE; DIFFERENTIAL STRUCTURE; MIXED MODE; MIXED-MODE S-PARAMETERS; TWO-PORT VNA; VECTOR NETWORK ANALYZERS;

SCATTERING PARAMETERS;

EID: 84954060509     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPTC.2003.1271579     Document Type: Conference Paper

References (5)

1. D. E. Bockelman and W. R. Eisenstadt, "Pure-Mode Network Analyzer for On-Wafer Measurements of Mixed-Mode S-Parameters of Differential Circuits," IEEE Trans. Microwave Theory Tech., vol. 43 (Jul. 1997), pp1071-1077.
2. D. E. Bockelman and W. R. Eisenstadt, "Combined differential and common-mode scattering parameters: Theory and simulation," IEEE Trans. Microwave Theory Tech., vol. 43 (Jul. 1995), pp. 1530-1539.
3. Application Notes: "Balanced Device Characterization," Agilent Technoloies, Jun. 2002.
4. Application Note 1373-1: "An Introduction to Multiport and Balanced device Measurements," Agilent Technologies, Nov. 2002.
5. K. Kurokawa, "Power Waves and the Scatering Matrix," IEEE Trans. Microwave Theory Tech., vol. 13 (Mar. 1965), pp. 194-202.