A calibration procedure for on-wafer differential load-pull measurements

61st ARFTG Conference Digest Spring 2003: Measurement Accuracy, ARFTG Spring 2003

Volumn , Issue , 2003, Pages 1-4

  Spirito, M ^a   Van Der Heijden, M P ^a   De Kok, M ^a   De Vreede, L C N ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

MEASUREMENT;

CALIBRATION ACCURACY; CALIBRATION PROCEDURE; CALIBRATION TECHNIQUES; LOAD-PULL MEASUREMENT; ON-WAFER;

CALIBRATION;

EID: 84954244399     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTGS.2003.1216860     Document Type: Conference Paper

References (5)

1. Bockelman, D.E.; Eisenstadt, W.R.; "Pure-mode network analyzer for on-wafer measurements of mixed-mode S-parameters of differential circuits", Microwave Theory and Techniques, IEEE Transactions on, Vol. 45 num. 7, pp 1071-1077, Jul 1997.
2. th ARFTG, December 1999.
3. Bockelman, D.E.; Eisenstadt, W.R.; "Pure-mode network analyzer for on-wafer measurements of mixed-mode S-parameters of differential circuits", Microwave Theory and Techniques, IEEE Transactions on, Vol. 45 num. 7, pp. 1071-77, Jul 1997.
4. th ARFTG, December 1997.
5. M.P. van der Heijden, M.Spirito, L.C.N. de Vreede, F. Van Straten and J.N. Burghartz; "A 2GHz High-Gain Differential InGaP HBT Driver Amplifier Matched for High IP3" to be published in 2003 IEEE MTT-S Digest, June 2003.