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Volumn 46, Issue 7, 1998, Pages 1009-1012

Calibration and verification of the pure-mode vector network analyzer

Author keywords

Calibration; Measurement; Measurement standards; Networks

Indexed keywords

CALIBRATION; CROSSTALK; ERROR CORRECTION; MEASUREMENTS; MICROWAVES; STANDARDS; TESTING;

EID: 0032122811     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.701459     Document Type: Article
Times cited : (30)

References (11)
  • 1
    • 0029342194 scopus 로고    scopus 로고
    • "Combined differential and common mode scattering parameters: Theory and simulation," vol. 43, pp. 1530-1539, July 1995.
    • D. E. Bockelman and W. R. Eisenstadt, "Combined differential and common mode scattering parameters: Theory and simulation," IEEE Trans. Microwave Theory Tech., vol. 43, pp. 1530-1539, July 1995.
    • IEEE Trans. Microwave Theory Tech.
    • Bockelman, D.E.1    Eisenstadt, W.R.2
  • 2
    • 0031186148 scopus 로고    scopus 로고
    • "Pure-mode network analyzer for on-wafer measurements of mixed-mode «-parameters of differential circuits," vol. 45, pp. 1071-1077, July 1997.
    • -_, "Pure-mode network analyzer for on-wafer measurements of mixed-mode «-parameters of differential circuits," IEEE Trans. Microwave Theory Tech., vol. 45, pp. 1071-1077, July 1997.
    • IEEE Trans. Microwave Theory Tech.
  • 3
    • 0017747923 scopus 로고    scopus 로고
    • "A generalization of the TSD network-analyzer calibration procedure, covering n-port scattering-parameter measurements, affected by leakage errors," 25, pp. 1100-1115, Dec. 1977.
    • R. A. Spéciale, "A generalization of the TSD network-analyzer calibration procedure, covering n-port scattering-parameter measurements, affected by leakage errors," IEEE Trans. Microwave Theory Tech., vol. MTT25, pp. 1100-1115, Dec. 1977.
    • IEEE Trans. Microwave Theory Tech., Vol. MTT
    • Spéciale, R.A.1
  • 4
    • 0024177728 scopus 로고    scopus 로고
    • "Thru-match-reflect: One result of a rigorous theory for de-embedding and network analyzer calibration," presented at the Proc. 18th European Microwave Conf., Stokholm, Sweden, Sept. 1988.
    • H.-J. Eul and B. Schiek, "Thru-match-reflect: One result of a rigorous theory for de-embedding and network analyzer calibration," presented at the Proc. 18th European Microwave Conf., Stokholm, Sweden, Sept. 1988.
    • Eul, H.-J.1    Schiek, B.2
  • 6
    • 0029408452 scopus 로고    scopus 로고
    • "Combined differential and common mode analysis of power splitters and combiners," vol. 43, pp. 2676-2632, Nov. 1995.
    • D. E. Bockelman and W. R. Eisenstadt, "Combined differential and common mode analysis of power splitters and combiners," IEEE Trans. Microwave Theory Tech., vol. 43, pp. 2676-2632, Nov. 1995.
    • IEEE Trans. Microwave Theory Tech.
    • Bockelman, D.E.1    Eisenstadt, W.R.2
  • 7
    • 33747244396 scopus 로고    scopus 로고
    • "An analysis of vector measurement accuracy enhancement techniques," presented at the Hewlett-Packard RF & Microwave Symp., Rec., Santa Rosa, CA, Mar. 1982.
    • D. Rytting, "An analysis of vector measurement accuracy enhancement techniques," presented at the Hewlett-Packard RF & Microwave Symp., Rec., Santa Rosa, CA, Mar. 1982.
    • Rytting, D.1
  • 8
    • 33747215534 scopus 로고    scopus 로고
    • "The theory, measurement, and application of mode specific scattering parameters with multiple mode of propagation," Ph.D. dissertation, Dept. Elect. Comput. Eng., Univ. Florida, Gainesville, May 1997.
    • D. E. Bockelman, "The theory, measurement, and application of mode specific scattering parameters with multiple mode of propagation," Ph.D. dissertation, Dept. Elect. Comput. Eng., Univ. Florida, Gainesville, May 1997.
    • Bockelman, D.E.1
  • 10
    • 0018720739 scopus 로고    scopus 로고
    • "Thru-Reflect-Line: An improved technique for calibrating the dual six-port automatic network analyzer," 27, pp. 987-993, Dec. 1979.
    • G. F. Engen and C. A. Hoer, "Thru-Reflect-Line: An improved technique for calibrating the dual six-port automatic network analyzer," IEEE Trans. Microwave Theory Tech., vol. MTT27, pp. 987-993, Dec. 1979.
    • IEEE Trans. Microwave Theory Tech., Vol. MTT
    • Engen, G.F.1    Hoer, C.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.