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Volumn , Issue , 2006, Pages 1793-1796
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Impact of device scaling on phase noise in SiGe HBTs UWB VCOs
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Author keywords
1 f noise; DCR; SiGe HBTs; UWB; VCO
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Indexed keywords
DEVICE SCALING;
DISTRIBUTED COUPLED RESONATORS (DCR);
NOISE SOURCES;
HETEROJUNCTION BIPOLAR TRANSISTORS;
OPTIMIZATION;
PHASE NOISE;
RESONATORS;
SEMICONDUCTING SILICON COMPOUNDS;
SHOT NOISE;
THERMAL NOISE;
VARIABLE FREQUENCY OSCILLATORS;
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EID: 34250354459
PISSN: 0149645X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/MWSYM.2006.249742 Document Type: Conference Paper |
Times cited : (11)
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References (10)
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