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Volumn , Issue , 2006, Pages 881-884

28V high-linearity and rugged InGaP/GaAs power HBT

Author keywords

Heterojunction bipolar transistor; Interchannel interference; Power amplifiers; Power bipolar amplifiers

Indexed keywords

DYNAMIC BIAS CIRCUITS; INTERCHANNEL INTERFERENCE; LINEAR POWER OPERATION; POWER BIPOLAR AMPLIFIERS; WCDMA MODULATION;

EID: 34250336862     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2006.249833     Document Type: Conference Paper
Times cited : (19)

References (6)
  • 1
    • 34250309488 scopus 로고    scopus 로고
    • N. L. Wang, C. Dunnrowicz, X. Chen, H. F. Chau, X. Sun, Y. Chen, B. Lin, I. L. Lo, C. H. Huang and M.H. T. Yang - High Efficiency 28V Class AB InGaP/GaAs HBT MMIC Amplifier with Integrated Bias Circuit, 2003 IEEE MTT-S Int. Microwave Symposium Digest, 3, pp, June 2003 pp. 2397-2402.
    • N. L. Wang, C. Dunnrowicz, X. Chen, H. F. Chau, X. Sun, Y. Chen, B. Lin, I. L. Lo, C. H. Huang and M.H. T. Yang - "High Efficiency 28V Class AB InGaP/GaAs HBT MMIC Amplifier with Integrated Bias Circuit", 2003 IEEE MTT-S Int. Microwave Symposium Digest, vol 3, pp, June 2003 pp. 2397-2402.
  • 4
    • 0035416329 scopus 로고    scopus 로고
    • Measurement Technique for Characterizing Memory Effects in RF Power Amplifier
    • August
    • J.H.K. Vuolevi, T. Rahkonen, J.P.A. Manninen, "Measurement Technique for Characterizing Memory Effects in RF Power Amplifier," IEEE Trans. MTT, Vol. 49, No. 8, pp. 1383-1389, August 2001.
    • (2001) IEEE Trans. MTT , vol.49 , Issue.8 , pp. 1383-1389
    • Vuolevi, J.H.K.1    Rahkonen, T.2    Manninen, J.P.A.3
  • 5
    • 0035307349 scopus 로고    scopus 로고
    • Influence of Impactlonization- Induced Instabilities on the Maximum Usable Output Voltage of Si-Bipolar Transistors
    • April
    • M. Rickelt, H-M Rein, E. Rose, "Influence of Impactlonization- Induced Instabilities on the Maximum Usable Output Voltage of Si-Bipolar Transistors," IEEE Trans. ED. Vol. 48. No. 4, pp. 774-779, April 2001.
    • (2001) IEEE Trans. ED , vol.48 , Issue.4 , pp. 774-779
    • Rickelt, M.1    Rein, H.-M.2    Rose, E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.