Measurement technique for characterizing memory effects in RF power amplifiers

IEEE Transactions on Microwave Theory and Techniques

Volumn 49, Issue 8, 2001, Pages 1383-1389

  Vuolevi, Joel H K ^b   Rahkonen, Timo ^a,b   Manninen, Jani P A ^b  

^a IEEE

^b UNIVERSITY OF OULU   (Finland)

Author keywords

Electrical memory effects; Predistortion; Thermal memory effects; Thermal power feedback; Three tone test setup

Indexed keywords

ADJACENT CHANNEL POWER RATIO (ACPR); ELECTRO-THERMAL EFFECTS;

ELECTRIC DISTORTION; FEEDBACK; FREQUENCY MODULATION; HETEROJUNCTION BIPOLAR TRANSISTORS; INTERMODULATION; MESFET DEVICES; MICROWAVE INTEGRATED CIRCUITS; THERMAL EFFECTS;

POWER AMPLIFIERS;

EID: 0035416329     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.939917     Document Type: Conference Paper

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