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Volumn 264, Issue , 2007, Pages 19-26

Intermixing in Cu/Co: Molecular dynamics simulations and Auger electron spectroscopy depth profiling

Author keywords

Atomistic computer simulations; Auger electron spectroscopy; Cu Co; Depth profiling; Ion solid interaction; Ion sputtering; Molecular dynamics; Multilayer; Sputter removal; Thin film

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COBALT COMPOUNDS; COMPUTER SIMULATION; INTERFACES (MATERIALS); MIXING; MOLECULAR DYNAMICS;

EID: 34249991723     PISSN: 10120386     EISSN: 16629507     Source Type: Journal    
DOI: 10.4028/3-908451-41-8.19     Document Type: Article
Times cited : (3)

References (22)
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  • 16
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    • http://www.mfa.kfki.hu/~sule/animations/cuco.htm.
  • 20
    • 1542318954 scopus 로고    scopus 로고
    • M. Cai, et al., J. Appl. Phys., 95, 1996 (2004).
    • (2004) J. Appl. Phys , vol.95 , pp. 1996
    • Cai, M.1
  • 21
    • 0008796135 scopus 로고    scopus 로고
    • Standard Guide for Depth Profiling in Auger Electron Spectroscopy
    • ASTM E 1127-91, ASTM: Philadelphia, PA
    • ASTM E 1127-91. Standard Guide for Depth Profiling in Auger Electron Spectroscopy. ASTM: Philadelphia, PA, (1997).
    • (1997)
  • 22
    • 34250009415 scopus 로고    scopus 로고
    • http://www.srim.org.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.