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Volumn 264, Issue , 2007, Pages 19-26
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Intermixing in Cu/Co: Molecular dynamics simulations and Auger electron spectroscopy depth profiling
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Author keywords
Atomistic computer simulations; Auger electron spectroscopy; Cu Co; Depth profiling; Ion solid interaction; Ion sputtering; Molecular dynamics; Multilayer; Sputter removal; Thin film
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
COBALT COMPOUNDS;
COMPUTER SIMULATION;
INTERFACES (MATERIALS);
MIXING;
MOLECULAR DYNAMICS;
ATOMISTIC COMPUTER SIMULATIONS;
ION-SOLID INTERACTION;
SPUTTER REMOVAL;
COPPER COMPOUNDS;
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EID: 34249991723
PISSN: 10120386
EISSN: 16629507
Source Type: Journal
DOI: 10.4028/3-908451-41-8.19 Document Type: Article |
Times cited : (3)
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References (22)
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