A helicity resolving soft X-ray emission spectrometer for studying magnetic circular dichroism with laboratory excitation sources

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 376, Issue 2, 1996, Pages 291-297

  Duda, L C ^a   Kuiper, P ^a   Mancini, D C ^a   Englund, C J ^a   Nordgren, J ^a  

^a UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATOR MAGNETS; CALIBRATION; ELECTRON GUNS; INTERFACES (MATERIALS); IRON; MAGNETIC RESONANCE; MAGNETIC THIN FILMS; MULTILAYERS; SCATTERING; X RAY SPECTROSCOPY; X RAYS;

HELICITY RESOLUTION; MAGNETIC CIRCULAR DICHROISM; SPECTRAL RESPONSE CURVE; X RAY EMISSION SPECTROMETER;

X RAY SPECTROMETERS;

EID: 0030192935     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(96)00263-X     Document Type: Article

References (18)

1. See e.g. articles in: MRS Bulletin 20(10) (1995).
2. N.V. Smith, C.T. Chen, F. Sette and L.F. Mattheiss, Phys. Rev. B 46 (1992) 1023.
3. H. Höchst, R. Patel and F. Middleton, Nucl. Instr. and Meth. A 347 (1994) 107.
4. C. Giles, C. Malgrange, J. Goulon, F. de Bergevin, C. Vettier, A. Fontaine, E. Dartyge, S. Pizzini, F. Baudelet and A. Freund, Physica B 208-209 (1995) 784.
5. J.B. Goedkoop, B.T. Thole, G. Van der Laan, G.A. Sawatzky, F.M.F. de Groot and J.C. Fuggle, Phys. Rev. B 37 (1988) 2086.
6. V.M. Matveev and V.V. Matveev, Physica B 208-209 (1995) 768.
7. C.-C. Kao, C.T Chen, E.D. Johnson, J.B. Hastings, H.J. Lin, G.H. Ho, G. Meigs, J.-M. Brot, S.L. Hulbert, Y.U. Idzerda and C. Vettier, Phys. Rev. B 50 (1994) 9599.
8. J. Nordgren, G. Bray, S. Cramm, R. Nyholm, J.-E. Rubensson and N. Wassdahl, Rev. Sci. Instr. 60 (1989) 1690.
9. R. Allenspach, D. Mauri, M. Taborelli and M. Landolt, Phys. Rev. B 35 (1987) 4801.
10. H. Rowland, Phil. Mag. 13 (1882) 469.
11. A. Michette and C. Buckley (eds.), X-Ray Science and Technology (Institute of Physics, King's College London, 1993).
12. K. Codling and P. Mitchell, J. Phys. E: Sci. Instr. 3 (1970) 685.
13. J. Budek, Technical report, Texas Instruments Ltd., Manton Lane, Bedford, England (unpublished).
14. J. Fink, Müller-Heinzerling, B. Scheerer, W. Speier, F. Hillebrecht, J. Fuggle, J. Zaanen and G. Sawatzky, Phys. Rev. B 32 (1985) 4899.
15. S. Blundell, M. Gester, J. Bland, C. Daboo, E. Gu, M. Baird and A. Ives, J. Appl. Phys. 73 (1993) 5948.
16. J.-M. Tonerre, L. Seve, D. Raoux, G. Soullie, B. Rodmacq and P. Wolfers Phys. Rev. Lett. 75 (1995) 740.
17. C.F. Hague, J.-M. Mariot, P. Strange, P.J. Durham and B.L. Gyorffy, Phys. Rev. B 48 (1993) 3560.
18. L.-C. Duda, J. Stöhr, D. Mancini, A. Nilsson, N. Wassdahl, J. Nordgren and M. Samant, Phys. Rev. B 50 (1994) 16758.