Joining of stainless-steel specimens with nanostructured Al/Ni foils

Journal of Applied Physics

Volumn 95, Issue 1, 2004, Pages 248-256

  Wang, J ^a   Besnoin, E ^a   Duckham, A ^a   Spey, S J ^a   Reiss, M E ^a   Knio, O M ^a   Weihs, T P ^a  

^a Johns Hopkins University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM FOIL; DIFFERENTIAL SCANNING CALORIMETRY; ENERGY DISPERSIVE SPECTROSCOPY; HEAT TRANSFER; MELTING; METALLOGRAPHIC MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; NICKEL; NUMERICAL METHODS; SCANNING ELECTRON MICROSCOPY; STAINLESS STEEL; X RAY DIFFRACTION ANALYSIS;

OPTICAL STEREOMICROSCOPY; REACTIVE JOINING; REACTIVE JOINTS; TENSILE SHEAR LAP TESTS; THERMAL TRANSPORT;

SOLDERING;

EID: 0942290052     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1629390     Document Type: Article

References (15)

1. E. Ma, C. V. Thompson, L. A. Clevenger, and K. N. Tu, Appl. Phys. Lett. 57, 1262 (1990).
2. L. A. Clevenger, C. V. Thompson, and K. N. Tu, J. Appl. Phys. 67, 2894 (1990).
3. U. Anselmi-Tamburni and Z. A. Munir, J. Appl. Phys. 66, 5039 (1989).
4. T. S. Dyer, Z. A. Munir, and V. Ruth, Scr. Metall. 30, 1281 (1994).
5. T. W. Barbee Jr. and Weihs, U.S. Patent No. 5,538,795 (1996).
6. T. W. Barbee, T. P. Weihs, and M. Park, U.S. Patent No. 5,547,715 (1996).
7. A. E. Grigoryan, N. G. Elistratov, D. Y. Kovalev, A. G. Merzhanov, A. N. Nosyrev, A. S. Rogachev, V. I. Khvesyuk, and P. A. Tsygankov, Dokl. Phys. Chem. 381, 368 (2001).
8. A. J. Gavens, D. V. Heerden, A. B. Mann, M. E. Reiss, and T. P. Weihs, J. Appl. Phys. 87, 1255 (2000).
9. T. P. Weihs, Handbook of Thin Film Process Technology (Institute of Physics, UK, 1998).
10. J. L. McNaughton and C. T. Mortimer, Differential Scanning Calorimetry (Perkin-Elmer, Norwalk, CT).
11. T. P. Weihs, M. A. Wall, and T. W. B. Jr., J. Mater. Res. 11, 1403 (1996).
12. C. Michaelsen, K. Barmak, and T. P. Weihs, J. Phys. D 30, 3167-3186 (1997).
13. M. E. Reiss, C. M. Esber, D. V. Heerden, A. J. Gavens, M. E. Williams, and T. P. Weihs, Mater. Sci. Eng., A 261, 217 (1999).
14. S. Jayaraman, O. M. Knio, A. B. Mann, and T. P. Weihs, J. Appl. Phys. 86, 800 (1999).
15. E. Besnoin, S. Cerutti, O. M. Knio, and T. P. Weihs, J. Appl. Phys. 92, 5474 (2002).